Shortlist

Voting terms and conditions
  • You can make only one vote per award category.
  • Votes will only be accepted from a current business email address.
  • Votes from third party email providers (hotmail, yahoo, etc) will NOT be counted.
  • A nominated company or supplier cannot vote for themselves or their nominee, any such votes will NOT be counted.
  • All voting closes on 1 March 2019.
  • Voters will be expected to provide their title, first name, last name, job title, email address and company name. The information is for vote validation purposes.
  • Any obvious voting abuses may result in nominee withdrawal.
Substrates and Materials Award

Great substrates and high-quality materials are key ingredients for making state-of-the-art devices. This award aims to showcase breakthroughs in this field, such as increases in the size or crystal quality of substrates, the unveiling of new materials, and the introduction of precursors with greater levels of purity.

Siltectra

Cold Split Technology

Agnitron Technology

MOCVD Capability for 10kV+ β-Ga2O3 Films

Allos Semiconductors

GaN-on-Silicon Epiwafer Technology Without Carbon Doping

Metrology Award

Measurements of substrates, epiwafers and devices are essential to manufacturing. This is needed to unveil problems with processes, ensure high yields and enable the delivery of products complying with specifications. This award will be contested by companies that offer specialist measurement services; and manufacturers of metrology equipment that either offer a new insight into materials, or set a new benchmark for the time taken for material characterisation.

Aehr Test Systems

FOX-CP System

Rigaku Corporation

The XRTmicron System